Quality Assurance
認証・品質
Our quality management system ensures every component meets your specification — with full documentation and traceability.
Certifications
Standards & Compliance
ISO 9001:2015
Quality Management System
Issued by: SGS / Bureau Veritas
Our QMS covers the full product lifecycle: raw material incoming inspection, in-process dimensional control, final quality verification, and traceability documentation.
Download CertificateSEMI Standards Compliance
Semiconductor Equipment & Materials
Issued by: SEMI International
Components manufactured in compliance with applicable SEMI standards for quartz and ceramic components used in semiconductor fabrication equipment.
RoHS Compliance
Restriction of Hazardous Substances
Issued by: EU Directive 2011/65/EU
All products conform to RoHS requirements, ensuring freedom from restricted hazardous substances including lead, mercury, cadmium, and hexavalent chromium.
Download CertificateREACH Compliance
Chemical Safety Regulation
Issued by: European Chemicals Agency (ECHA)
We provide REACH declarations confirming the absence of substances of very high concern (SVHC) above threshold levels in our products.
Download CertificateQuality Process
Our 4-Stage Quality Control
Incoming Material Inspection
Every batch of raw quartz, sapphire, and ceramic material undergoes XRF/ICP-OES purity verification before entering production.
In-Process Dimensional Control
Operators use calibrated gauges at defined intervals; CMM verification is performed at critical machining stages.
Final Quality Inspection
100% dimensional verification on critical-to-function features; surface roughness, cleanliness, and visual inspection.
Traceability & Documentation
Each order ships with material certificates, inspection reports, and dimensional data sheets traceable to calibrated instruments.
Inspection Equipment
Measurement Capabilities
| Equipment | Brand / Model | Capability | Accuracy |
|---|---|---|---|
| CMM (Coordinate Measuring Machine) | Hexagon / Zeiss | 3D dimensional measurement | ±0.001 mm |
| Surface Roughness Tester | Mitutoyo SJ-410 | Ra / Rz / Rq parameters | 0.001 μm resolution |
| Optical Profile Projector | Nikon V-24B | Contour / profile inspection | ±0.001 mm |
| XRF Spectrometer | Rigaku / Bruker | Elemental composition analysis | ppm level |
| ICP-OES / ICP-MS | PerkinElmer / Agilent | Trace metal impurity analysis | ppb level |
| Helium Leak Tester | Pfeiffer Vacuum | Gas tightness of welded assemblies | <1×10⁻⁹ mbar·L/s |